Technical
Specifications
Built for high analytical reliability and industrial-grade metal analysis with fast workflows and multi-matrix flexibility.
Applications
Fe, Al, Cu, Ni, Zn, Ti, Mg, Co, Pb, Sn
Special Analysis
N/O/H in Ti, O in Cu & Steel, Low N in Steel, Na/Li in Al
Detector
CMOS or hybrid PMT + CMOS
Wavelength Range
120 – 900 nm
Optical Chamber
Equipped with vacuum system
Software
EOS® proprietary software
Alloy Database
UNI, ASTM, DIN
Power Supply
110/220 V AC, 16 A, 1 kW
Dimensions
600 × 1300 × 1200 mm
